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IEC 61163-1:2006
Reliability stress screening - Part 1: Repairable assemblies manufactured in lots
SKU: iec_004718_036257
Published by IEC
Publication Year 2006
2.0 Edition
161 pages
Product Details
This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.