Codes & Standards - Purchase
IEC 60749-36:2003
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
SKU: iec_003383_029753
Published by IEC
Publication Year 2003
1.0 Edition
7 pages
Product Details
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.